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NOVITEC 2021. Dec_NEWSLETTER

admin 2021-12-24 17:49:00 View 142



NEWS LETTER

2021.Dec www.novitec.co.kr
 
 
 
Glass thickness and refractive index determine the quality
Tokyo Optical Technology Exhibition - Photonix 2021
Novitec participated in Photonix 2021, an optical technology exhibition held at Tokyo Makuhari Exhibition Center for 3 days from December 8th to December 10th.

The Photonix exhibition is the largest exhibition in Japan specializing in laser and optical technology, where world-class companies exhibit lasers, optical components, optical measuring devices, and analysis equipment to identify trends in the optical market and share technical information.

Novitec exhibited t-Nova-SDI, a non-contact thickness and refractive index sensor, and s-Nova series, a high-speed spectrometer, that can be used for various fields such as semiconductor display manufacturing inspection, medical and biological analysis. 

​​​​​​​Thank you very much for your interest.
Ultrafast thickness measurement sensor
t-Nova-SDI 1550


- Simultaneous measurement of physical thickness
  and refractive index
- Vibration insensitive measurement
- High speed measurement & High precision
- Wide applicability to various substrate materials

​​​​​​​  (Glass, Silicon wafer, etc.)
High-speed spectrometer enabling pc-less
​​​​​​​ultra-fast thickness measurement
s-Nova-850


- Wavelength range : 750 - 950 nm 
- Wavelength accuracy : 0.1 nm
- Measurement speed : 250 kHz
- Optimal for various optical measuring devices,
  Thin film analysis, OCT
High-speed spectrometer enabling pc-less
​​​​​​​ultra-fast thickness measurement
s-Nova-1550


- Wavelength range : 1490 - 1610 nm 
- Wavelength accuracy : 0.1 nm
- Measurement speed : 40 kHz
- Optimal for various optical measuring devices,
  silicon wafer thickness measurement
 
 

May the new year bring your health, happiness, and all other good things.

Wishing you a wonderful end of 2021,
and all the best wishes to you in a new year.

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